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X-ray seminar

Seminarium Rentgenowskie Stacjonarnie

SIMS and the evidence of band crossing in Pb1−xSnxTe

01-10-2024 10:30 - 11:30
Venue
Institute of Physics PAS, Room D, Building I
Speaker
mgr Zeinab Khosravizadeh
Affiliation
Instytut Fizyki PAN
Sala
Sala D

This study proposes and validates the use of secondary ion mass spectrometry (SIMS) to estimate band crossing positions in Pb1−xSnxTe. SIMS signal ratios of Sn±/Te± and Pb±/Te±  were analyzed, revealing variations in ionization probabilities dependent on electronic parameters like work function, and electron affinity. These ionization probabilities are influenced by the energy gap's position relative to the vacuum level for different x values in Pb1−xSnxTe.

This research not only underscores the potential of SIMS as a robust analytical technique for advanced materials but also enhances the understanding of the electronic structure of topological crystalline insulators.

 

 
 

List of Dates (Page event details)

  • 01-10-2024 10:30 - 11:30
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