Centre of Photon, Electron and Ion Advanced Methods for Natural Science CEPHEUS


Workshop on Advanced Method for Interpretation of TEM, X-Ray and SIMS Measurements in Nano and Atomic Scale


1-3 June 2005 Warsaw, Poland



Announcement Poster


A4_plakat.pdf (1261KB)

A3_plakat.pdf (1931KB)









Invited Speakers:


Prof. V.Holy

Masaryk University,

Faculty of Sciences

61137 Brno,

Czech Republic

Lecture: X-ray investigation of self-organized semiconductor nanostructures


Dr Massimo Bersani

Physics and Chemistry

Of Surface and Interface Division

Via Sommarive 18

38050 Povo-Trento


Lecture: Ultra Shallow Depth Profiling by SIMS in microelectronic materials and processes


Dr Ana Sanchez

Depto. Ciencias Materiales

E I.M. y Q.I.

Facultad de Ciencias

Campus Universitario de Puerto Real

11510 Puerto Real



Lecture: The plasmon peak in EELS: A new technique to determine the strain in semiconductor heterostructures?


Dr Pedro L. Galindo Riano

Depto. Lenguajes y Sistemas Informaticos

Facultad de Ciencias

Campus Universitario de Puerto Real

11510 Puerto Real



Lecture: The peak Pairs strain mapping algorithm and its application to HRTEM images



Dr Martin Hyetch


15, rue Georges Urbain

94407 Vitry-sur-Seine


Lecture: Geometric Phase Method and their application in materials characterization


Prof. Andreas Rosenauer

IFP-University Bremen,

Otto-Hahn-Alee 1

28359 Bremen


Lecture: Composition evaluation by lattice fringe analysis (CELFA) in semiconductors nanostructures investigation



Dr Hubert Renevier

Commissariat a l’ Energie Atomique

Department de Recherche Fondamentale

Sur la Matiere Condense


Lecture: Grazing Incidence Anomalous Diffraction and Diffraction Anomalous Fine Structure (GIDAFS) to study nanostructures



Prof. Sven Hovmoeller

Stockholm University,

Structural Chemistry

SE-10691 Stockholm


Lecture: Computer aided electron crystallography as powerful tool to structure determination



Dr Kurt Scheerschmidt

Max Planck Institute of

Microstructure Physics

Weinberg 2

D-06120 Halle


Lecture: Molecular dynamics modeling for enhanced interpretation of TEM images



Dr Erik Knudsen

Riso National Laboratory

P.O. Box 49

DK-4000 Roskilde


Lecture: Algorithms and Instrumentation for generating 3d grain maps in polycrystals by 3DXRD



Scope of the Workshop:

q       Selected revue of new approaches to computer methods for data analysis;

q       Theoretical and practical presentation of modern method of experimental data acquisition and processing;

q       Presentation and comparison of possibility and limitation of different experimental techniques used for structure characterization in nano and atomic scale.

q       Computer methods of structure modeling applied to interpretation of experimental measurements;


Overview of lecture topics area

Progress in physics and technology requires quantitative information about internal structure in nanometer and atomic scales of modern materials.

New measurement methods like synchrotron radiation (XRSR), high resolution transmission electron microscopy, secondary ion mass spectroscopy (SIMS) offer information owing to advanced computer aid processing of raw experimental data. Even correctly performed experiment and data processing with all states of art procedure and tricks usually do not give simple reply to questions about internal structure. The quantitative interpretation of data needs strong physical background of experiment and understanding of its key parameters, knowledge of instrument limitation, etc. It is important to identify the possible sources of artifacts and their impact on results.  Nowadays, the simulation based on the realistic model of investigated object and experiment is necessary to correct the interpretation of data.

The way from the raw data to physical quantities can be divided into two main steps:

-  visualization, storage, systematization, calibration and deconvolution of data,

-  quantitative comparing of theoretical models of  object and experiment simulation with “real word” results.

During the Workshop the invited speakers will present new and the most effective methodology of chosen experimental techniques, such as X-Ray, SIMS, and TEM/HRTEM areas, appropriate for characterization of nanostructures and nanomaterials like: quantum structures, integrated devices, nanocrystalline materials.

A part of the Workshop will be concerned with presentation of the methods creating a realistic computer model of investigated sample and its application to data interpretation. Such a model can be generated by means of the molecular dynamics where the probable configuration of defect cores and interface at atomic level exist. However, in larger scale the continuum approach, applying the finite element methods, is better adopted to model a probable stress state and chemical gradients in investigated sample.


Formula of the Workshop

Tutorial plenary lectures will be addressed to researchers and Ph.D students having the basic knowledge of each of the experimental methods (SIMS, X-Ray, TEM). Additionally, the spare time will be reserved for discussion and computer exercises in small groups (3-8 persons).

Workshop will be held at the Institute of Physics of the Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland.



Workshop Organizers

Chairperson:     S.  Kret             kret@ifpan.edu.pl

Secretary:          H. Granat          granat@ifpan.edu.pl



Workshop on Advanced Method for Interpretation of TEM, X-Ray and SIMS Measurements in Nano and Atomic Scale”, Warszawa 1-3 June  2005.

The Workshop was organized in the  framework of  the European   Program Centre of Excellence CEPHEUS.

During the  Workshop  invited  talks were devoted to presentation of the most advanced  recent methods of interpretation of the  transmission electron microscopy images, x-ray  diffraction and  absorption spectra  as well the SIMS  measurements. The lectures had a tutorial and revue character permitting the young scientists  to  learn about  recent developments.

Both the principles of these methods,  source of artifact and  the error and precision of such measurements were presented by the experts.




The participants who were mostly  the  young people and experienced  scientists had the possibility to deepen  his knowledge or learn  about new developments in structural characterization of materials  in nanometrric scale. Especially , there was opportunity to compare  possibilities of these methods giving  information about local structure, as the quantitative  transmission electron  microscopy, with the information delivered by  the synchrotron radiation techniques  giving  averaged information from a bigger volume.

The invited specialists usually presented unpublished data and newly developed concepts. The talks were interrupted by questions  of participants thus, the rule was  10 minutes discussions after each lecture.

Abstracts of all lectures were collected  in the Workshop’s booklet. Every author was asked to introduce into his article  the main idea of experimental methods, examples of results and references permitting  deeper learning and understanding.

The exercises and free discussions gave the opportunity to concentrate  participant’s attention to the  particular problems  and to obtain the assistance from the invited experts in solving  these problems. 




During 3 days’ meeting 18 lectures were performed by the invited specialists from the Europe, (10  speakers from the best European research centers, invited within the European Community Program Centre of Excellence “CEPHEUS”).  Lectures as well 5 hours exercises were hold in the Institute of Physics. In total  72 participants were participated in the Workshop .